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Home　/　Category　/　Manufacture of electronic component　/　Image measuring instrument

Image measuring instrument

3D image measuring instrument

The LKE 3D image measuring instrument is equipped with the binocular vision measurement system to measure the object being measured and output results by combining with advanced algorithm software. It is available for measurement of true position and coplanarity of chip metal solder balls after ball mounting or metal dome of connector. It has the advantages of non-contact measurement, fast speed, and high precision.

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021-5456 1588

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product details

Introduction

The LKE 3D image measuring instrument is applicable to products such as CPU sockets, Memory&Dram IC chips. At present, over 40 sets are installed on the market.


1716177467584208.jpg

Parameters

LKE300

3D Technology

LKE 3D -Socket Vison 3.1

Max Device Size(mm

100x100

Camera(pixel size)

25Mpxl(4.5μm)

Resolutio

20μm/pxl

Illumination

Red

Line Patter

LED

Module size WxHxD in m

760 x630x265

lmage Compute

Win10

3D pin Acc/Re

15 μm
2D pin Acc/Rep10 μm

Speed for LGA 1700 pi

800ms Total

Speed for 4000 pin

<1.8sec

Host protocol

IO 64
Working principle

检测原理.jpg


The LKE 3D image measuring instrument forms images by camera 1 and camera 2 separately, and then analyzes and calculates these images to calculate information of the objects being measured from the parallax △ X and △ Z.

Testing items

Number

Test item

BALL SIDE

PIN SIDE

PRODUCT

1

CO

√

√

 

2

XO

√

√

 

3

YO

√

√

 

4

RO

√

√

 

5

CX

√

√

 

6

CY

√

√

 

7

WI

√

 

 

8

BH

√

 

 

9

GAP H

√

 

 

10

WP

 

 

√

Product series

Model/Specification

LKE100

LKE200

LKE300

LKE400

Camera

12M

25M

25M

25M

XY resolution (μm)

12.5

12.8

20

25

FOV(mm)

50x50

66x60

100x100

120x120

Measuring depth (mm)

3

5

5

5

Measuring precision (μm)

10

10

15

15

Image frequency (FPS)

Max 20

Max 30

Max 30

Max 30
Overall dimensions

外形尺寸.jpg

LKE100/LKE200：W*H*T=720*630*265mm LKE300/LKE400：W*H*T=760*920*390mm

Terminal surface

Static repeatability

Static repeatability.jpg


Dynamic repeatability

Dynamic repeatability.jpg


Correlation with QV

Correlation with QV.jpg

Spherical surface

Static repeatability

Static repeatability.jpg


Dynamic repeatability

Dynamic repeatability.jpg


Correlation with QV

Correlation with QV.jpg

Sample data summary


CO

XO

YO

Static repeatability(P/T%)

Dynamic repeatability(P/T%)

QV correlation

Static repeatability(P/T%)

Dynamic repeatability(P/T%)

QV correlation

Static repeatability(P/T%)

Dynamic repeatability(P/T%)

QV correlation

Terminal surface

9.87%

19.65%

85.2%

4.25%

8.98%

91.6%

7.78%

8.98%

92.5%

Spherical surface

8.36%

15.52%

91.6%

2.94%

5.56%

93.7%

2.69%

7.44

95.4%

Application cases

1716176543860317.jpg

Customer group

合作伙伴.jpg

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